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Introduction

Nanoparticles, a unique subset of the broad field of nanotechnology, include any type of particle with at least one dimension of less than 500 nanometers. Nanoparticles play an important role in a wide variety of fields



 
Sample Preparation
Scanning Probe Microscopy has been routinely employed as a surface characterization technique for nearly 20 years. Atomic Force Microscopy is the most widely used subset of SPM, which can be used in ambient conditions with minimum sample preparation.



characterization

Atomic Force Microscopy is a very well established technique to characterize surface topography or morphology of individual particles. AFM particle characterization software packages provide comprehensive tools for analyzing nanoparticles. The main objective of this paper is to focus on AFM nanoparticle analysis data interpretation.


 
Particle analysis manual
The Particle Analysis module in NanoRule+™ provides advanced software algorithms to locate particles in an image and then make measurements of the features, such as area, perimeter, height, length, width etc. The program also provides complete statistics about each feature and collections of particles.

 
 
 
 

 
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