Pacific Nanotechnology Inc.

Advancing Nanoparticles Technology

Nanoparticles Newsletter
September 2006

	It is our pleasure to introduce you to 3D particle characterization software "Outline, Count, Measure". It is integrated into NanoRule+® AFM image analysis software. Height, volume and surface roughness, only a few among many other particle morphology characterization parameters, can be available to you within a few mouse clicks!. see more...
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Quantity or Quality? Visualization or accurate measurements? Both modalities are equally important in the field of nanotechnology and science. With AFM you do not need to compromise one against another. Both quantitative and qualitative particle characterization is fully supported by NanoRule+®...see more..