Pacific Nanotechnology is pleased to announce that “AFM Metrology for Nanoparticle & Nanostructures Characterization: Visualization, Morphology Quantitation and Probe Artifacts” presentation is available on MRS web-site. It comes in audio-visual format and takes 15 mins. including questions. It’s free to download for MRS member.
If you are attending Material Science and Technology Meeting (MS&T’07) in Detroit, Michigan, on September 16-20, 2007, Pacific Nanotechnology will be presenting its results on nanoparticle research completed in collaboration with UC Irvine.
print now
