Nanoparticles Newsletter
July 2006
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Many parameters such as particle size, height, volume and morphology
at the nanoscale are easily measured with an Atomic Force Microscope (AFM).
Applications range from nanometer sized quantum dots and colloids to
hundred-nanometer sized polymers and liposomes to micron sized powders and
bio-cells ... read more |
Scanning Probe Microscopy(SPM) is the Nobel Prize winning technique
capable of measuring 3-dimensional topographic images with resolutions
comparable to or greater than SEM/TEM. AFM is the most widely used type of
SPM. With an AFM measurements can be made in ambient conditions, there is no
requirement for sample to be conductive, and physical properties associated
with the surface can be visualized ...read more. |
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