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Advancing Nanoparticles Technology |
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Nano-Rp™
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Nano-Rp™ , a complete particle characterization system, is an innovative, easy-to-use, and productive atomic force microscope designed for capturing three-dimensional images of nanoparticles. The state-of-the-art laboratory scanning probe microscope can be used in both EZModeTM and X’pertModeTM . It includes everything required for AFM imaging nanoparticle. An Atomic Force Microscope (AFM) allows you to directly visualize the three dimensional topography of nanoparticles, as well as to measure nanoparticle size and volume distributions. There is little or no sample preparation required with an AFM ......
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Accesories
Pacific Nanotechnology offers applications support to assure your success with our product. Our nanoparticle accessories kit includes everything required for nanoparticle imaging: particle reference sample, nanoflat substrates, NanoRule+™ particle characterization software and three-part applications papers. Several times a year Pacific Nanotechnology offers introductory and advanced training class to assure you get the most from your AFM.The two day training course is intended to help PNI customers learn what is
required to scan and analyze nanoparticles with the Nano-Rp™ SPM. The training
includes classroom discussions and hands on operation of the Nano-Rp™ SPM.
The training cource also includes an introductory lecture on theory of SPM (Scanning Probe Microscope) and covers detailed analysis on Nanoparticle Sample Preparation ,SPM operation and image analysis ......Among the major applications include and
Nanoparticle Technology-Particle Characterization with AFM
Atomic Force Microscopy is a very well established technique to characterize surface topography or morphology of individual particles. AFM particle characterization software packages provide comprehensive tools for analyzing nanoparticles. The main objective of this paper is to focus on AFM nanoparticle analysis data interpretation......
NnaoRule+™ particle characterization software provides most efficient way to charecterize AFM nanoparticle data. The Particle Analysis module is an option for NanoRule+™; SPM analysis software and is used for identifying and analyzing particles. There are several provisions for identifying particles. Once identified, many parameters including area, perimeter, height, and length may be calculated. Several options are available for reporting the results from the particle analysis software option......
Nanoparticle Products-Nano Flat
Nanoflat substrates are specially prepared for the attachment/fixing of many sizes and shapes of nanoparticles,
in order to image these particle dispersions with an Atomic Force Microscope (AFM). The substrates are pre-mounted on standard Atomic Force Microscope (AFM)
sample holders. There are seven Nanoflat substrates and they may be purchased in two formats:.......
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